Giant Tunneling Electroresistance with Low Resistance-Area in Bilayer Nb2NF2 Nanosheet Ferroelectric Tunnel Junctions

被引:0
作者
Yu, Guorong [1 ]
Liu, Bin [1 ]
Liu, Xiao [1 ]
Zhang, Shichen [1 ]
Zhu, Sicong [1 ]
Shen, Lei [2 ]
机构
[1] Wuhan Univ Sci & Technol, Int Res Inst Steel Technol, Collaborat Innovat Ctr Adv Steels, Hubei Prov Key Lab Syst Sci Met gwehgdegwtrgtyrtPr, Wuhan 430081, Peoples R China
[2] Natl Univ Singapore, Dept Mech Engn, Singapore 117575, Singapore
基金
中国国家自然科学基金;
关键词
Nb2NF2; van der Waals ferroelectric tunneljunction; metallic ferroelectric; tunneling electroresistance; resistance-area; PHYSICS;
D O I
10.1021/acsanm.4c04923
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Conventional van der Waals ferroelectric tunnel junctions (FTJs), consisting of a two-dimensional (2D) semiconducting ferroelectric tunneling barrier, have undergone extensive experimental and theoretical investigation. Compared to ferroelectric semiconductors, the recently reported 2D metal ferroelectrics contribute to the performance of FTJs due to their excellent conductivity and low resistivity. This material increases the tunneling electroresistance (TER) and reduces the resistance-area (RA) for more efficient current transfer. In this work, we systematically investigate the electronic transport properties of the bilayer metal ferroelectric Nb2NF2 (2L-Nb2NF2)-based devices using first-principles calculations and the nonequilibrium Green's function method. We found that the TER of Au/2L-Nb2NF2/Au at zero bias can be 1 order of magnitude higher than that of the reported bilayer semiconducting ferroelectric In2Se3 while exhibiting a 2 orders of magnitude lower RA of 0.05 Omega mu m2. The improved performance is attributed to the high electrical conductivity of 2L-Nb2NF2 and its contact with the metal to achieve a ferroelectric-antiferroelectric phase transition. These studies demonstrate the potential of metallic ferroelectrics and the metal-contact effect in transport in the field of nanoscale nonvolatile ferroelectric memory.
引用
收藏
页码:25797 / 25804
页数:8
相关论文
共 69 条
[1]   Tunneling electroresistance effect in a Pt/Hf0.5Zr0.5O2/Pt structure [J].
Ambriz-Vargas, F. ;
Kolhatkar, G. ;
Thomas, R. ;
Nouar, R. ;
Sarkissian, A. ;
Gomez-Yanez, C. ;
Gauthier, M. A. ;
Ruediger, A. .
APPLIED PHYSICS LETTERS, 2017, 110 (09)
[2]   SYMMETRY CONSIDERATIONS ON MARTENSITIC TRANSFORMATIONS - FERROELECTRIC METALS [J].
ANDERSON, PW ;
BLOUNT, EI .
PHYSICAL REVIEW LETTERS, 1965, 14 (07) :217-&
[3]   Tunneling electroresistance of MgZnO-based tunnel junctions [J].
Belmoubarik, Mohamed ;
Al-Mahdawi, Muftah ;
Obata, Masao ;
Yoshikawa, Daiki ;
Sato, Hideyuki ;
Nozaki, Tomohiro ;
Oda, Tatsuki ;
Sahashi, Masashi .
APPLIED PHYSICS LETTERS, 2016, 109 (17)
[4]   Density-functional method for nonequilibrium electron transport -: art. no. 165401 [J].
Brandbyge, M ;
Mozos, JL ;
Ordejón, P ;
Taylor, J ;
Stokbro, K .
PHYSICAL REVIEW B, 2002, 65 (16) :1654011-16540117
[5]   Artificial two-dimensional polar metal at room temperature [J].
Cao, Yanwei ;
Wang, Zhen ;
Park, Se Young ;
Yuan, Yakun ;
Liu, Xiaoran ;
Nikitin, Sergey M. ;
Akamatsu, Hirofumi ;
Kareev, M. ;
Middey, S. ;
Meyers, D. ;
Thompson, P. ;
Ryan, P. J. ;
Shafer, Padraic ;
N'Diaye, A. ;
Arenholz, E. ;
Gopalan, Venkatraman ;
Zhu, Yimei ;
Rabe, Karin M. ;
Chakhalian, J. .
NATURE COMMUNICATIONS, 2018, 9
[6]   Vertical Graphene Tunneling Heterostructure with Ultrathin Ferroelectric BaTiO3 Film as a Tunnel Barrier [J].
Chan, Hung-Lit ;
Yuan, Shuoguo ;
Hao, Jianhua .
PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2018, 12 (09)
[7]   Giant magnetoresistance and tunneling electroresistance in multiferroic tunnel junctions with 2D ferroelectrics [J].
Chen, Yancong ;
Tang, Zhiyuan ;
Dai, Minzhi ;
Luo, Xin ;
Zheng, Yue .
NANOSCALE, 2022, 14 (24) :8849-8857
[8]   Intercorrelated In-Plane and Out-of-Plane Ferroelectricity in Ultrathin Two-Dimensional Layered Semiconductor In2Se3 [J].
Cui, Chaojie ;
Hu, Wei-Jin ;
Yan, Xingu ;
Addiego, Christopher ;
Gao, Wenpei ;
Wang, Yao ;
Wang, Zhe ;
Li, Linze ;
Cheng, Yingchun ;
Li, Peng ;
Zhang, Xixiang ;
Alshareef, Husam N. ;
Wu, Tom ;
Zhu, Wenguang ;
Pan, Xiaoqing ;
Li, Lain-Jong .
NANO LETTERS, 2018, 18 (02) :1253-1258
[9]  
Datta S., 1997, ELECT TRANSPORTIN ME
[10]   Physics of thin-film ferroelectric oxides [J].
Dawber, M ;
Rabe, KM ;
Scott, JF .
REVIEWS OF MODERN PHYSICS, 2005, 77 (04) :1083-1130