Origin and Compensation of Nonlinearity in Near-Navigation Grade Piezoresistive MEMS Gyroscope

被引:1
作者
Laita, Gabriele [1 ]
Buffoli, Andrea [2 ]
Robert, Philippe [2 ]
Langfelder, Giacomo [1 ]
机构
[1] Politecn Milan, Dipartimento Elettron Informaz & Bioingn, I-20133 Milan, Italy
[2] CEA Leti, F-38000 Grenoble, France
关键词
Inertial navigation; micro-electro-mechanical system (MEMS) gyroscopes; NEMS; nonlinearity; stability;
D O I
10.1109/JSEN.2024.3462598
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The manuscript researches on nonlinearity sources in micro-electro-mechanical system (MEMS) yaw gyroscopes based on resistive sensing gauges with (250-nm)(2) cross section, coupled to a dedicated integrated circuit. Possible nonlinearity sources in the mechanical, electrical, and electronic domains are initially identified. A detailed investigation of all of them from a theoretical standpoint and/or from software simulations, indicates the Wheatstone half-bridge readout method and the electro-mechanical softening induced by the dc voltage applied at the quadrature electrodes as the predicted dominant sources. However, experimental measurements highlight how another source of linearity error appears for the proposed device, which is ascribed to the piezoresistive coefficient, with a negative-cubic (thus, sub-linear) trend. At the same time, the softening due to the dc voltage at quadrature compensation electrodes is expected to bring a positive-cubic (super-linear) effect. The dc voltage at the compensation electrodes is thus increased, according to the theoretical predictions. In the new situation, linearity errors are reduced by almost an order of magnitude down to 0.02% at the target full-scale range (FSR). The presence of nonlinearities of opposite sign, compensating one another after proper small voltage trimming, is unique to this piezoresistive sensing method.
引用
收藏
页码:34162 / 34169
页数:8
相关论文
共 23 条
[1]   Investigation of High-Sensitivity Piezoresistive Pressure Sensors at Ultra-Low Differential Pressures [J].
Basov, Mikhail ;
Prigodskiy, Denis M. .
IEEE SENSORS JOURNAL, 2020, 20 (14) :7646-7652
[2]   Upgrading a gyroscope from a lab-based setup into a pre-industrial demo: challenges and lessons learned [J].
Buffoli, Andrea ;
Robert, Philippe ;
Langfelder, Giacomo .
2024 IEEE INTERNATIONAL SYMPOSIUM ON INERTIAL SENSORS AND SYSTEMS, INERTIAL, 2024,
[3]   0.02°/h, 0.004°/√h, 6.3-mA NEMS Gyroscope With Integrated Circuit [J].
Buffoli, Andrea ;
Gadola, Marco ;
Sansa, Marc ;
Langfelder, Giacomo .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2023, 72
[4]  
Challoner AD, 2014, IEEE POSITION LOCAT, P504, DOI 10.1109/PLANS.2014.6851410
[5]   MEMS Gyroscopes Based on Piezoresistive NEMS Detection of Drive and Sense Motion [J].
Dellea, Stefano ;
Rey, Patrice ;
Langfelder, Giacomo .
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2017, 26 (06) :1389-1399
[6]   Near-Navigation Grade Tuning Fork MEMS Gyroscope [J].
Endean, Daniel ;
Christ, Kevin ;
Duffy, Patrick ;
Freeman, Eugene ;
Glenn, Max ;
Gnerlich, Markus ;
Johnson, Burgess ;
Weinmann, Jacob .
2019 6TH IEEE INTERNATIONAL SYMPOSIUM ON INERTIAL SENSORS & SYSTEMS (INERTIAL 2019), 2019,
[7]   1.3 mm2 Nav-Grade NEMS-Based Gyroscope [J].
Gadola, Marco ;
Buffoli, Andrea ;
Sansa, Marc ;
Berthelot, Audrey ;
Robert, Philippe ;
Langfelder, Giacomo .
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2021, 30 (04) :513-520
[8]   Combining Lissajous Frequency Modulation With 250 nm Piezoresistive Sensing in MEMS Gyroscope: Theoretical Advantages and Practical Challenges [J].
Gianollo, Matteo ;
Gadola, Marco ;
Bettini, Giada ;
Padovani, Christian ;
Robert, Philippe ;
Langfelder, Giacomo .
IEEE SENSORS LETTERS, 2023, 7 (11)
[9]   Practical Approaches to Allan Deviation Analysis of Low-Cost MEMS Inertial Sensors [J].
Hiller, Tobias ;
Vujadinovic, Milos ;
Blocher, Lukas ;
Mayer, Wolfram ;
Radovic, Dusan ;
Balslink, Thorsten ;
Northemann, Thomas ;
Buhmann, Alexander .
2023 IEEE INTERNATIONAL SYMPOSIUM ON INERTIAL SENSORS AND SYSTEMS, INERTIAL, 2023,
[10]  
IEEE, 2019, IEEE Std 528-2019, P1, DOI [10.1109/IEEESTD.2019.8863799, DOI 10.1109/IEEESTD.2019.8863799]