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Effect of Substrate Thinning on Temperature Rise in Ga2O3 Rectifiers
被引:0
作者:
Chiang, Chao-Ching
[1
]
Li, Jian-Sian
[1
]
Wan, Hsiao-Hsuan
[1
]
Ren, Fan
[1
]
Pearton, Stephen J.
[2
]
机构:
[1] Univ Florida, Dept Chem Engn, Gainesville, FL 32611 USA
[2] Univ Florida, Dept Mat Sci & Engn, Gainesville, FL 32611 USA
关键词:
semiconductors;
thermodynamics;
wide energy bandgap;
Ga2O3;
gallium oxide;
NIO/BETA-GA2O3 HETEROJUNCTION DIODE;
SCHOTTKY-BARRIER DIODES;
D O I:
10.1149/2162-8777/ad89fa
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
The low thermal conductivity of beta-Ga2O3 is a concern for the high-power switching applications envisaged for this ultra-wide bandgap semiconductor. In this work, we examine the effect of substrate thinning to reduce the temperature rise in rectifiers under high power conditions and also reduce the on-resistance. The Ga2O3 substrates on which the rectifiers were fabricated were thinned from the original thickness of 630 mu m to a lowest value of 50 mu m and transferred to a brass heat sink. Experimentally, we observed that the on-resistance was reduced from 5.66 to 5.17 m Omega.cm(2) when thinning to 50 mu m, in excellent agreement with simulations. The calculated peak temperature rise was roughly halved for rectifiers on such thin substrates over a broad range of power densities (500-1500 W.cm(2)), a result supported by thermal imaging.
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页数:5
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