Effect of Substrate Thinning on Temperature Rise in Ga2O3 Rectifiers

被引:1
作者
Chiang, Chao-Ching [1 ]
Li, Jian-Sian [1 ]
Wan, Hsiao-Hsuan [1 ]
Ren, Fan [1 ]
Pearton, Stephen J. [2 ]
机构
[1] Univ Florida, Dept Chem Engn, Gainesville, FL 32611 USA
[2] Univ Florida, Dept Mat Sci & Engn, Gainesville, FL 32611 USA
关键词
semiconductors; thermodynamics; wide energy bandgap; Ga2O3; gallium oxide; NIO/BETA-GA2O3 HETEROJUNCTION DIODE; SCHOTTKY-BARRIER DIODES;
D O I
10.1149/2162-8777/ad89fa
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The low thermal conductivity of beta-Ga2O3 is a concern for the high-power switching applications envisaged for this ultra-wide bandgap semiconductor. In this work, we examine the effect of substrate thinning to reduce the temperature rise in rectifiers under high power conditions and also reduce the on-resistance. The Ga2O3 substrates on which the rectifiers were fabricated were thinned from the original thickness of 630 mu m to a lowest value of 50 mu m and transferred to a brass heat sink. Experimentally, we observed that the on-resistance was reduced from 5.66 to 5.17 m Omega.cm(2) when thinning to 50 mu m, in excellent agreement with simulations. The calculated peak temperature rise was roughly halved for rectifiers on such thin substrates over a broad range of power densities (500-1500 W.cm(2)), a result supported by thermal imaging.
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页数:5
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