Blind forgery detection using enhanced mask-region convolutional neural network

被引:0
|
作者
Tallapragada V.V.S. [1 ]
Reddy D.V. [2 ]
Kumar G.V.P. [3 ]
机构
[1] School of Engineering, Department of ECE, Mohan Babu University, Andhra Pradesh, Tirupati
[2] Department of ECE, Mahatma Gandhi Institute of Technology, Gandipet, Hyderabad
[3] Department of ECE, Chaitanya Bharathi Institute of Technology, Gandipet, Hyderabad
关键词
Blind forgery detection; Deep learning; Enhanced mask-RCNN; Manipulated features; Optimization; Overlapping blocks; Tampered region;
D O I
10.1007/s11042-024-19347-w
中图分类号
学科分类号
摘要
This work proposes a DL model for locating and classifying the forgery images. The proposed work has stages like pre-processing, feature extraction, segmentation, localization, and forgery detection. The input RGB images are converted into an YCbCr colour model in the pre-processing stage. Due to the size of the blocks, the processing time may be increased. Hence, the input images are split into overlapping blocks to reduce the time complexity. Here, a series of residual blocks are utilized for feature extraction, segmentation, and localization. Hybrid DL model Enhanced Mask-RCNN carries out this process. The Enhanced Mask-RCNN integrates the residual network with Mask-RCNN (Mask-region convolutional neural network). In this hybrid network, the residual network is used to extract the features, and the Mask-RCNN is used to segment, locate, and detect the tampered region. Further, the neural network weights are optimized by sandpiper optimization (SO) to enhance the recognition accuracy. The performance of a proposed forgery detection model is compared with three benchmark datasets and attained better accuracy of 0.991, 0.997, and 0.997 on the GRIP, Coverage, and CASIA-V1 datasets, respectively. © The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature 2024.
引用
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页码:84975 / 84998
页数:23
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