Correction to: Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions (Flexible Services and Manufacturing Journal, (2024), 36, 2, (567-596), 10.1007/s10696-023-09501-1)

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作者：

Deenen, Patrick C. ^{[1
,2
]}

Middelhuis, Jeroen ^{[1
]}

Akcay, Alp ^{[1
]}

Adan, Ivo J. B. F. ^{[1
]}

机构：

[1] Department of Industrial Engineering and Innovation Sciences, Eindhoven University of Technology, De Zaale, Eindhoven,5600 MB, Netherlands

[2] Industrial Technology and Engineering Centre (ITEC), Nexperia, Jonkerbosplein 52, Nijmegen,6534 AB, Netherlands

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页码：597 / 598