In-situ transmission electron microscopy (TEM) investigation of the reduction process in graphene oxide

被引:1
|
作者
da Silva, Douglas S. [1 ]
Viana, Gustavo A. [1 ]
da Silva Filho, Jose Maria C. [1 ]
Kretly, Luiz C. [2 ]
Neto, Antonio M. J. C. [3 ]
Vieira, Lucia [4 ]
Barros, Tarcio A. S. [2 ]
Marques, Francisco C. [1 ]
机构
[1] Univ Estadual Campinas UNICAMP, Inst Fis Gleb Wataghin, BR-13083970 Campinas, SP, Brazil
[2] Univ Estadual Campinas UNICAMP, Escola Engn Elect & Computacao, Campinas, SP, Brazil
[3] Univ Fed Para, BR-66075110 Belem, PA, Brazil
[4] Univ Vale Paraiba IP & D UNIVAP, Inst Pesquisa & Desenvolvimento, BR-12244000 Sao Jose Dos Campos, SP, Brazil
基金
巴西圣保罗研究基金会;
关键词
GRAPHITE; NANOSHEETS; FILMS;
D O I
10.1557/s43580-024-00998-8
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The reduction processes of graphene oxide (GO) aim to remove functional groups such as H2O, CO, and CO2 to promote the properties of GO towards those of pure graphene. We adopted the thermal reduction process from room temperature to 320 degrees C. The transmission electron microscopy (TEM) technique was used to probe the effect of reduction mechanisms. It was observed that the plasmon peaks, referring to sp2 carbon bonds in crystalline structures, are more evident in the reduced graphene oxide (rGO) than GO. The fine structure at the K edge of carbon shows differences in shape linked to the density of states above the Fermi level. Electron energy loss spectroscopy (EELS) analyses revealed an increase in the fraction of sp3 bonds in the reduced sample, consistent with the reduction of functional radicals in the GO structure.
引用
收藏
页码:1472 / 1477
页数:6
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