Two-frame random phase-shifting interferometry immune to the influence of tilted phase-shift

To expand the reliability of interferometry technology, this paper proposes a random two-frame algorithm with high accuracy, high robustness, and immunity to tilt phase-shift. This method uses the equivalence of inter-frame phase-shift and intra-frame phase difference to mine light intensity pixels carrying new phase-shift from different images. Then, the linear random phase-shift plane is fitted by least squares, and the inverse tangent relationship is used to obtain a high-precision phase distribution. This technology uses the principle of light intensity equivalence to fit the linear phaseshift plane and does not require any iterative process. It can effectively suppress the influence of tilt phase-shift while ensuring computational efficiency. The paper verifies that the proposed algorithm has excellent performance in both tilted and non-tilted conditions through simulation and gence (AI) training, and similar technologies, are reserved.