Effect of micro Fe and Si on microstructure and properties of aluminum conductive rod

The effects of Fe and Si on the microstructure and properties of aluminum conductive rod were investigated by electron backscatter diffraction(EBSD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), scanning probe microscopy (SPM), room temperature tensile, single arm bridge and nanoindentation creep. The results indicate that Fe and Si can reduce the grain size of the conductive rod, making the texture component change from weak〈001〉+〈111〉 double texture to sharp〈111〉texture. The presence of Al-Fe and Al-Fe-Si phases is observed to be distributed along the extrusion direction, and appear obvious dislocation pile-up at the second phase and (sub) grain boundary. Fe and Si promote recrystallization through coarse particles and inhibit recrystallization through fine particles, resulting in periodic alternating distribution of the microstructure of the conductive rod along the radial direction. Fe and Si can significantly improve the strength and creep resistance of aluminum conductive rod at the expense of small conductivity. © 2024 Central South University of Technology. All rights reserved.