TGSYOLO: Template-Guidance Siamese Network for SMT Welding Defect Detection

被引:0
作者
Shi, Kehao [1 ,2 ,3 ]
Yu, Chengkai [4 ,5 ]
Cao, Yang [1 ,5 ]
Kang, Yu [1 ,5 ,6 ]
Zhao, Yunbo [1 ]
Zhao, Lijun [3 ]
Xu, Zhenyi [2 ,5 ]
机构
[1] Univ Sci & Technol China, Dept Automat, Hefei 230026, Peoples R China
[2] Minist Educ, Key Lab Syst Control & Informat Proc, Shanghai 200240, Peoples R China
[3] Yangtze River Delta Hart Robot Ind Technol Res Ins, Wuhu 241000, Peoples R China
[4] Anhui Univ, AHU IAI AI Joint Lab, Hefei 230601, Peoples R China
[5] Hefei Comprehens Natl Sci Ctr, Inst Artificial Intelligence, Hefei 230088, Peoples R China
[6] Chinese Acad Sci, Key Lab Technol GeoSpatial Informat Proc & Applica, Beijing 100192, Peoples R China
来源
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY | 2024年 / 14卷 / 12期
关键词
Defect detection; Feature extraction; Transformers; Welding; Production; Accuracy; Convolutional neural networks; YOLO; Manuals; Costs; Multiscale feature fusion; siamese network; surface mounted technology (SMT) welding defect detection; template guidance; MACHINE;
D O I
10.1109/TCPMT.2024.3491163
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Surface-mounted technology (SMT) welding defect detection plays a key role in the printed circuit board assembly (PCBA) production process, which affects the use of electronic products and cost. Previous works tend to realize defect detection with only defect samples and they assume that there are sufficient defect samples. However, defect samples are usually difficult to collect in real-life scenarios while enough template samples can be easily obtained. In addition, most existing works carry out defect detection based on benchmarks with simple backgrounds of PCBA, which is not suitable for PCBA with complex structures in modern electronic product manufacturing. To address the above issues, we propose a template-guidance Siamese network based on YOLO for SMT welding defect detection (TGSYOLO), which is deployed on a real SMT automatic optical inspection (AOI) system. First, the two-stream structure is introduced to extract deep features in defect images and template images, in which template features serve as guidance knowledge. Then, a template fusion Transformer (TFT) is proposed to model global features between detect and template features in the low-level stage, which could acquire long-range correlations to force the network to focus on potential defect regions. Next, to avoid the disappearance of tiny defect features during deep feature fusion, a multiscale attention feature pyramid network (MAFPN) is proposed to directly fuse defect semantic information from low-level features, which retains detailed expressions of defects through skip connection and obtains compact fusion features. Furthermore, we collect limited welding defect samples based on more complex PCBA backgrounds than previous works through a real SMT AOI system. Experiments on the limited dataset show that TGSYOLO could reach 0.985 of mAP@0.5, 0.885 of mAP@0.75, and 0.984 of F1, which is 0.008, 0.054, and 0.025 higher than other SOTA methods. Also, generalization experiments on the public DeepPCB show that TGSYOLO could still reach the best with 0.991 of mAP@0.5 and 0.89 of mAP@0.75, which proves that TGSYOLO has good generalization performance.
引用
收藏
页码:2391 / 2404
页数:14
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