Comments and Corrections: Reply to Comments on "Anisotropic Microwave Properties of Vertically Aligned Carbon Nanotube Arrays"

被引:0
作者
Lum, Lucas [1 ]
Ng, Zhi Kai [1 ]
Jiang, Rong Tao [1 ]
Tan, Chong Wei [1 ]
Teo, Edwin Hang Tong [1 ]
Tay, Beng Kang [1 ]
机构
[1] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore
关键词
Dielectrics; Rectangular waveguides; Carbon nanotubes; Permittivity measurement; Length measurement; Anisotropic; Accuracy; Substrates; Size measurement; Permittivity; Anisotropy; carbon nanotubes (CNTs); dielectric materials; dielectric measurement; permeability; permittivity; rectangular waveguides;
D O I
10.1109/TMTT.2024.3485246
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Accurately measuring the dielectric properties of anisotropic materials is challenging due to their fragility and small size. This study addressed these issues for vertically aligned carbon nanotubes (VACNTs) by engineering them to delaminate from the substrate, retain orientation and porosity, and grow to millimeter lengths. This approach allowed for effective use of the Nicolson-Ross-Weir (NRW) method without additional techniques. While alternative methods by Susek et al. and Knisely et al. might offer higher accuracy, the proposed method is practicable with commercially available equipment, achieving reliable dielectric measurements.
引用
收藏
页码:7087 / 7087
页数:1
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