Editorial for the Special Issue on the Latest Advancements in Semiconductor Materials, Devices and Systems

被引：0

作者：

Chen, Xinghuan ^{[1
]}

Wang, Fangzhou ^{[2
]}

Wang, Zirui ^{[3
]}

Wang, Zeheng ^{[4
]}

Huang, Jing-Kai ^{[5
,6
]}

机构：

[1] China Elect Prod Reliabil & Environm Testing Res, Guangzhou 510610, Peoples R China

[2] Songshan Lake Mat Lab, Dongguan 523808, Peoples R China

[3] Peking Univ, Sch Integrated Circuits, Beijing 100871, Peoples R China

[4] CSIRO, Mfg, Lindfield, NSW 2070, Australia

[5] City Univ Hong Kong, Dept Syst Engn, Kowloon, Hong Kong 999077, Peoples R China

[6] Univ New South Wales UNSW, Sch Mat Sci & Engn, Sydney, NSW 2052, Australia

来源：

MICROMACHINES | 2024年 / 15卷 / 12期

关键词：

D O I：

10.3390/mi15121422

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页数：4

共 35 条

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