Impact of thickness and saturation direction over magnetostatic mode energies and profiles in Ni80Fe20 antidots

被引：0

作者：

Chiroli, S. ^{[1
]}

Faurie, D. ^{[1
]}

Adeyeye, A. O. ^{[2
,3
]}

Zighem, F. ^{[1
]}

机构：

[1] Univ Sorbonne Paris Nord, LSPM CNRS, UPR 3407, Villetaneuse, France

[2] Natl Univ Singapore, Dept Elect & Comp Engn, Informat Storage Mat Lab, Singapore, Singapore

[3] Univ Durham, Dept Phys, Durham, England

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 2025年 / 58卷 / 01期

关键词：

micromagnetic simulations; magnetostatic mode; ferromagnetic resonance; mode profiles; MAGNETIC NORMAL-MODES; ARRAY;

D O I：

10.1088/1361-6463/ad7d9f

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The magnetization dynamics of square arrays of circular antidots fabricated on Si(001) substrates using deep ultraviolet lithography with a 248 nm exposing wavelength have been studied. The effects of thickness (40 nm and 80 nm) and the in-plane direction of the applied magnetic field on the magnetostatic mode energies were investigated through ferromagnetic resonance experiments and micromagnetic simulations for both thicknesses. The experimental results and the simulations allowed the determination of nature of the magnetostatic modes nature measured at angles of 0 degrees and 45 degrees between the applied magnetic field and the axis of the square array. Notably, in this geometry, the main modes do not disapear when the sample is rotated; instead, the localization of the modes follow the rotation of the applied field, with a variation in measured intensity directly related to the surface area occupied by the localized mode.

引用

页数：6