Combining electron microscopy with atomic-scale calculations-A personal perspective

被引:0
|
作者
Pantelides, Sokrates T. [1 ,2 ]
机构
[1] Vanderbilt Univ, Dept Phys & Astron, Nashville, TN 37235 USA
[2] Vanderbilt Univ, Dept Elect & Comp Engn, Nashville, TN 37235 USA
关键词
electron microscopy; EELS; density-functional-theory calculations; 07.78.+s; 61.72.Bb; 61.46.Hk; GRAIN-BOUNDARIES; NANOWIRES;
D O I
10.1088/1674-1056/ad8ece
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
I had the privilege and the pleasure to work closely with Stephen J. Pennycook for about twenty years, having a group of post-docs and Vanderbilt-University graduate students embedded in his electron microscopy group at Oak Ridge National Laboratory, spending on average a day per week there. We combined atomic-resolution imaging of materials, electron-energy-loss spectroscopy, and density-functional-theory calculations to explore and elucidate diverse materials phenomena, often resolving long-standing issues. This paper is a personal perspective of that journey, highlighting a few examples to illustrate the power of combining theory and microscopy and closing with an assessment of future prospects.
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页数:10
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