Towards the FAIRification of Scanning Tunneling Microscopy Images

被引:0
|
作者
Tommaso Rodani [1 ]
Elda Osmenaj [2 ]
Alberto Cazzaniga [1 ]
Mirco Panighel [2 ]
Cristina Africh [2 ]
Stefano Cozzini [1 ]
机构
[1] AREA Science Park
[2] CNR-IOM, Consiglio Nazionale delle Ricerche–Istituto Officina dei
关键词
D O I
暂无
中图分类号
TN16 [电子光学仪器]; TP391.41 [];
学科分类号
0803 ; 080401 ; 080203 ;
摘要
In this paper, we describe the data management practices and services developed for making FAIR compliant a scientific archive of Scanning Tunneling Microscopy(STM) images. As a first step, we extracted the instrument metadata of each image of the dataset to create a structured database. We then enriched these metadata with information on the structure and composition of the surface by means of a pipeline that leverages human annotation, machine learning techniques, and instrument metadata filtering. To visually explore both images and metadata, as well as to improve the accessibility and usability of the dataset, we developed “STM explorer” as a web service integrated within the Trieste Advanced Data services(TriDAS) website. On top of these data services and tools, we propose an implementation of the W3C PROV standard to describe provenance metadata of STM images.
引用
收藏
页码:27 / 42
页数:16
相关论文
共 50 条
  • [41] SCANNING TUNNELING MICROSCOPY
    EDELMAN, VS
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1989, 32 (05) : 993 - 1022
  • [42] SCANNING TUNNELING MICROSCOPY
    BINNIG, G
    ROHRER, H
    PHYSICA B & C, 1984, 127 (1-3): : 37 - 45
  • [43] SCANNING TUNNELING MICROSCOPY
    BINNIG, G
    ROHRER, H
    HELVETICA PHYSICA ACTA, 1982, 55 (06): : 726 - 735
  • [44] SCANNING TUNNELING MICROSCOPY
    GRIFFITH, JE
    KOCHANSKI, GP
    ANNUAL REVIEW OF MATERIALS SCIENCE, 1990, 20 : 219 - 244
  • [45] CORRELATION BETWEEN SCANNING TUNNELING MICROSCOPY SPECTROSCOPY IMAGES AND APEX PROFILES OF SCANNING TIPS
    NISHIKAWA, O
    TOMITORI, M
    IWAWAKI, F
    HIRANO, N
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (01): : 421 - 424
  • [46] SCANNING-TUNNELING-MICROSCOPY AND SCANNING FORCE MICROSCOPY
    ALVARADO, SF
    SURFACE REVIEW AND LETTERS, 1995, 2 (05) : 607 - 617
  • [47] Photon scanning tunneling microscopy and reflection scanning microscopy
    Goudonnet, J.P.
    Salomon, L.
    Cerre, N.
    Fornel, F. De
    Ferrell, T.L.
    1600, Publ by Springer-Verlag New York, Secaucus, NJ, US
  • [48] IMAGES OF CHARGE-DENSITY WAVES OBTAINED WITH SCANNING TUNNELING MICROSCOPY
    COLEMAN, RV
    MCNAIRY, WW
    SLOUGH, CG
    HANSMA, PK
    DRAKE, B
    SURFACE SCIENCE, 1987, 181 (1-2) : 112 - 118
  • [49] SCANNING TUNNELING MICROSCOPY IMAGES OF EPITAXIALLY GROWN BETA-SIC
    CHANG, CS
    TSONG, IST
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1990, 73 (11) : 3134 - 3134
  • [50] Denoising scanning tunneling microscopy images of graphene with supervised machine learning
    Joucken, Frederic
    Davenport, John L.
    Ge, Zhehao
    Quezada-Lopez, Eberth A.
    Taniguchi, Takashi
    Watanabe, Kenji
    Velasco Jr, Jairo
    Lagoute, Jerome
    Kaindl, Robert A.
    PHYSICAL REVIEW MATERIALS, 2022, 6 (12):