Phase-shifting Moire deflectometry

被引：0
|
作者：
Pfeifer, T. [1 ]
Wang, B. [1 ]
Evertz, J. [1 ]
Tutsch, R. [1 ]
机构：
[1] Fraunhofer-Inst fuer, Produktionstechnologie, Aachen, Germany
来源：
Optik (Jena) | 1995年 / 98卷 / 04期
关键词：
713.5 Other Electronic Circuits - 741.1 Light/Optics - 741.3 Optical Devices and Systems - 921.6 Numerical Methods;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
9
引用
收藏
页码：158 / 162
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