Defect-induced Si(100) dimer buckling structures studied by scanning tunneling microscopy

被引：0
作者：
Uchikawa, Michihiro [1 ]
Ishida, Masahiko [1 ]
Miyake, Koji [1 ]
Hata, Kenji [1 ]
Yoshizaki, Ryozo [1 ]
Shigekawa, Hidemi [1 ]
机构：
[1] Univ of Tsukuba, Tsukuba, Japan
来源：
Surface Science | 1996年 / 357-358卷 / 1-3期
关键词：
D O I：
Proceedings of the 1995 13th International Vacuum Congress and the 9th International Conference on Solid Surfaces, IVC-13/ICSS-9
中图分类号：
学科分类号：
摘要：
Surface structure
引用
收藏
页码：468 / 471
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