Electric field diffraction by a semi-infinite perfectly conducting plane of small thickness: application to near-field microscopy

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Dept. of Elec. Engineering, Technion, Haifa 32000, Israel [1 ]
不详 [2 ]
不详 [3 ]
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来源：
Microwave Opt Technol Lett | / 3卷 / 177-183期
关键词：
Diffraction - Electromagnetic fields - Electromagnetic wave propagation - Light polarization - Mathematical transformations - Numerical methods - Optical microscopy - Partial differential equations - Thickness measurement;
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