Electric field diffraction by a semi-infinite perfectly conducting plane of small thickness: application to near-field microscopy

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Dept. of Elec. Engineering, Technion, Haifa 32000, Israel ^{[1
]}

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]}

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]}

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来源：

Microwave Opt Technol Lett | / 3卷 / 177-183期

关键词：

Diffraction - Electromagnetic fields - Electromagnetic wave propagation - Light polarization - Mathematical transformations - Numerical methods - Optical microscopy - Partial differential equations - Thickness measurement;

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[1] Electric field diffraction by a semi-infinite perfectly conducting plane of small thickness:: Application to near-field microscopy
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