Damage profile examination on ion irradiated peek by 6Li doping and neutron depth profiling technique

被引：0
|
作者：
Vacik, J. [1 ]
Cervena, J. [1 ]
Hnatowicz, V. [1 ]
Svorcik, V. [1 ]
Kobayashi, Y. [1 ]
Fink, D. [1 ]
Klett, R. [1 ]
机构：
[1] Nuclear Physics Inst, Rez, Czech Republic
来源：
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms | 1998年 / 141卷 / 1-4期
关键词：
This work was supported by the Grant Agency of Czech Republic under the contracts No. 202/96/0077 and 202-96-K038;
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摘要：
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页码：216 / 222
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