TECHNOLOGY'S IMPACT ON HARDWARE RELIABILITY.

被引：0

作者：

Mathur, Francis P.

机构：

来源：

Computer | 1979年 / 12卷 / 04期

关键词：

DATA STORAGE; SEMICONDUCTOR - Storage Devices - RELIABILITY;

D O I：

10.1109/MC.1979.1658705

中图分类号：

学科分类号：

摘要：

The paper presents some problems of reliability, testing, and quality assurance of semiconductor memories. Three methods are reviewed for hardware testing: a) method for highly sequential circuits testing, b) microprocessor testing, when faults are associated with registers and functions rather than with gates, and c) the method which consists of deriving a graph-theoretic model from the ″user's manual″ description. The paper reflects part of materials from the conference ″Exploding Technology, Responsible Growth″ that took place at February-March, 1979, in San Francisco.

引用

页码：91 / 93

页数：2