TECHNOLOGY'S IMPACT ON HARDWARE RELIABILITY.

被引：0
|
作者：
Mathur, Francis P.
机构：
来源：
Computer | 1979年 / 12卷 / 04期
关键词：
DATA STORAGE; SEMICONDUCTOR - Storage Devices - RELIABILITY;
D O I：
10.1109/MC.1979.1658705
中图分类号：
学科分类号：
摘要：
The paper presents some problems of reliability, testing, and quality assurance of semiconductor memories. Three methods are reviewed for hardware testing: a) method for highly sequential circuits testing, b) microprocessor testing, when faults are associated with registers and functions rather than with gates, and c) the method which consists of deriving a graph-theoretic model from the ″user's manual″ description. The paper reflects part of materials from the conference ″Exploding Technology, Responsible Growth″ that took place at February-March, 1979, in San Francisco.
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页码：91 / 93
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