共 50 条
[32]
Automatic Test Signal Generation for Mixed-Signal Integrated Circuits using Circuit Partitioning and Interval Analysis
[J].
PROCEEDINGS 2016 IEEE INTERNATIONAL TEST CONFERENCE (ITC),
2016,
[39]
ADC for mixed-signal SoC
[J].
INTERNATIONAL CONFERENCE ON SIGNALS AND ELECTRONIC SYSTEMS (ICSES '10): CONFERENCE PROCEEDINGS,
2010,
:253-256