Layer-by-layer analysis of three-dimensional component distributions in rapidly solidified low alloyed aluminum alloys

被引：0
|
作者：
Tashlykova-Bushkevich, I.I. [1 ]
Shepelevich, V.G. [1 ]
机构：
[1] Belorusskij GU, Minsk, Belarus
来源：
Fizika i Khimiya Obrabotki Materialov | 2000年 / 04期
关键词：
Alloying elements - Aluminum alloys - Antimony - Copper - Germanium - Heat treatment - Iron - Rutherford backscattering spectroscopy - Solidification;
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中图分类号：
学科分类号：
摘要：
By means of Rutherford backscattering spectroscopy technique a detailed component depth distributions in rapidly solidified foils of Al-Me (Me=Fe, Cu, Sb) and Al-Ge alloys have been investigated. It was found that on the foil surface (0.04-0.06 mm depth) the component concentrations exceed the experimental measured values. Me concentration oscillates through the thickness of the layers investigated, while in the rapidly solidified Al-Ge alloy no component oscillation was detected.
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页码：99 / 105
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