Carbon nanotubes as tips for atomic force microscopy

被引:0
|
作者
Guo, Li-Qiu [1 ,2 ]
Xu, Zong-Wei [1 ]
Zhao, Tie-Qiang [1 ]
Zhao, Qing-Liang [1 ]
Zhang, Fei-Hu [1 ]
Dong, Shen [1 ]
机构
[1] Precision Eng. Res. Inst., Harbin Inst. of Technol., Harbin 150001, China
[2] Sch. of Mech. Eng., Tsinghua Univ., Beijing 100084, China
关键词
D O I
暂无
中图分类号
学科分类号
摘要
Carbon nanotubes
引用
收藏
页码:223 / 227
相关论文
共 50 条
  • [21] Atomic force microscopy investigation of electrochemically produced carbon nanotubes
    不详
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2001, 72 : S189 - S192
  • [22] Automated Manipulation of Carbon Nanotubes Using Atomic Force Microscopy
    Zhang, Chao
    Wu, Sen
    Fu, Xing
    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2013, 13 (01) : 598 - 602
  • [23] Proteins crystal tips for atomic force microscopy
    Wickremasinghe, NS
    Hafner, J
    BIOPHYSICAL JOURNAL, 2005, 88 (01) : 540A - 540A
  • [24] Polymer tips for application of atomic force microscopy
    Kim, Woo-Sik
    Park, Kang-Min
    Park, Jung Jin
    Chang, Sang-Mok
    Kim, In-Ho
    Muramatsu, Hiroshi
    Kim, Jong Min
    CURRENT APPLIED PHYSICS, 2007, 7 (05) : 528 - 531
  • [25] Electrical conduction of carbon nanotube atomic force microscopy tips: Applications in nanofabrication
    Austin, Alexander J.
    Nguyen, Cattien V.
    Ngo, Quoc
    JOURNAL OF APPLIED PHYSICS, 2006, 99 (11)
  • [26] Carbon nanotube atomic force tips
    不详
    CHEMIE INGENIEUR TECHNIK, 2001, 73 (08) : 1050 - 1050
  • [27] Thermoacoustic Emission from Carbon Nanotubes Imaged by Atomic Force Microscopy
    Passeri, Daniele
    Sassi, Ugo
    Bettucci, Andrea
    Tamburri, Emanuela
    Toschi, Francesco
    Orlanducci, Silvia
    Terranova, Maria Letizia
    Rossi, Marco
    ADVANCED FUNCTIONAL MATERIALS, 2012, 22 (14) : 2956 - 2963
  • [28] Imaging the elastic properties of coiled carbon nanotubes with atomic force microscopy
    Volodin, A
    Ahlskog, M
    Seynaeve, E
    Van Haesendonck, C
    Fonseca, A
    Nagy, JB
    PHYSICAL REVIEW LETTERS, 2000, 84 (15) : 3342 - 3345
  • [29] Studying electrical transport in carbon nanotubes by conductance atomic force microscopy
    Gomez-Navarro, C.
    de Pablo, P. J.
    Gomez-Herrero, J.
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2006, 17 (06) : 475 - 482
  • [30] Studying electrical transport in carbon nanotubes by conductance atomic force microscopy
    C. Gómez-Navarro
    P. J. de Pablo
    J. Gómez-Herrero
    Journal of Materials Science: Materials in Electronics, 2006, 17 : 475 - 482