TRENDS IN VLSI TESTING.

被引：0

作者：

Chalkley, Michael J.

机构：

来源：

Digest of Papers - Semiconductor Test Symposium | 1979年

关键词：

INTEGRATED CIRCUITS - Large Scale Integration;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

One of the most significant recent developments in VLSI testability is discussed, and a test method of its implementation proposed. Future trends in testers are predicted based on identifiable testing needs.

引用

页码：3 / 6