Correlation between structural, optical and electrical properties of μc-Si films

被引：0
|
作者：
Krankenhagen, R. [1 ]
Schmidt, M. [1 ]
Grebner, S. [1 ]
Poschenrieder, M. [1 ]
Henrion, W. [1 ]
Sieber, I. [1 ]
Koynov, S. [1 ]
Schwarz, R. [1 ]
机构：
[1] Hahn-Meitner-Inst Berlin GmbH, Berlin, Germany
来源：
Journal of Non-Crystalline Solids | 1996年 / 198-200卷 / pt 2期
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页码：923 / 926
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