Study of the Si(111)√3×√3-Sb structure by x-ray diffraction

被引:0
|
作者
Nakatani, Shinichiro [1 ]
Saito, Akira [1 ]
Kuwahara, Yuji [1 ]
Takahashi, Toshio [1 ]
Aono, Masakazu [1 ]
Kikuta, Seishi [1 ]
机构
[1] Univ of Tokyo, Tokyo, Japan
来源
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 1992年 / 31卷 / 4 A期
关键词
Semiconducting Silicon;
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学科分类号
摘要
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页码:426 / 428
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