In situ measurement on ultraviolet dielectric components by a pulsed top-hat beam thermal lens

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Inst. fur Optik/Quantenelektron., Friedrieh-Schiller-Univ. Jena, Max-Wien-Platz 1, D-07743 Jena, Germany [1 ]
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Applied Optics | 2000年 / 39卷 / 25期
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摘要：
Dielectric materials
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页码：4690 / 4697
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