Reasons for Defects Which Occur in Plastics Sealed Semiconductor Devices.

被引：0

作者：

Nowacki, Janusz

Szyszej, Katarzyna

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来源：

| 1600年 / 13期

关键词：

Compendex;

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暂无

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摘要：

SEMICONDUCTOR DEVICES

引用

共 10 条

[1] Measurements of Noise in Semiconductor Devices.
Spiralski, Ludwik
Elektronika Warszawa, 1980, 21 (11): : 15 - 22
[2] MICROWAVE AND MILLIMETER WAVE SEMICONDUCTOR DEVICES.
Fank, F.Beringer
International Telemetering Conference (Proceedings), 1978, 14 : 905 - 911
[3] Fast Determination of the Thermal Resistance of Semiconductor Devices.
Poehlmann, Bernd
Elektronik Munchen, 1980, 29 (22): : 125 - 127
[4] Application of Ion Implantation to the Manufacture of Semiconductor Devices.
Saczuk, Krzysztof
1600, (13):
[5] X-RAY RADIATION EFFECTS ON SEMICONDUCTOR DEVICES.
Chauhan, A.S.
Maheshwari, L.K.
Indian Journal of Pure and Applied Physics, 1975, 13 (04): : 226 - 228
[6] METHOD OF ANALYZING RADIO SYSTEMS CONTAINING SEMICONDUCTOR DEVICES.
Asovich, P.L.
1600, (32-33):
[7] Investigation of Thermal States of High-power Semiconductor Devices.
Staszak, Zbigniew
Gulczynski, Janusz
Elektronika Warszawa, 1980, 21 (11): : 25 - 27
[8] LASER SCANNING OF ACTIVE INTEGRATED CIRCUITS AND DISCRETE SEMICONDUCTOR DEVICES.
Sawyer, D.E.
Berning, D.W.
Lewis, D.C.
1600, (20):
[9] RESETDOMINATE RING COUNTER USING COMPLEMENTARY METAL-OXIDE SEMICONDUCTOR DEVICES.
Blount, F.
Chin, W.B.
Hansen, K.M.
Pomeranz, J.N.
1600, (16):
[10] Computer Analysis of Transient Processes in Gate Circuits Using Electron-Bombarded Semiconductor Target Devices.
D'yakonov, V.P.
Zienko, S.I.
Samoilova, T.A.
Izvestia vyssih ucebnyh zavedenij. Priborostroenie, 1980, 23 (03): : 56 - 60