DON'T BE STRANGLED BY EMI-FILTER TEST SPECS.

被引:0
|
作者
Peterson, Arlen
机构
关键词
SIGNAL INTERFERENCE - Suppression;
D O I
暂无
中图分类号
学科分类号
摘要
It is claimed that emi filters tested in accordance with MIL-STD-220A specifications, are not accurately characterized. Claimed deficiencies include exclusive testing with 50-ohm source and load impedances, inaccurate results from comparison testing of various networks and filters, using dc for full-load tests of filters used in ac circuits, testing that does not simulate actual operating conditions, and no provisions for testing line-to-line type filters.
引用
收藏
页码:86 / 89
相关论文
共 50 条
  • [31] A Don't Care Identification Method for Test Compaction
    Yamazaki, Hiroshi
    Wakazono, Motohiro
    Hosokawa, Toshinori
    Yoshimura, Masayoshi
    PROCEEDINGS OF THE 2013 IEEE 16TH INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS & SYSTEMS (DDECS), 2013, : 215 - 218
  • [32] Don’t rubbish Myers–Briggs personality test
    Penny Moyle
    Nature, 2018, 563 (7730) : 184 - 184
  • [33] Don't Give Up On the Turing Test Response
    French, Robert M.
    COMMUNICATIONS OF THE ACM, 2013, 56 (03) : 8 - 8
  • [34] Relays Fail - Test Systems Don't Have To
    Dolman, Jordan
    Schreier, Luke
    IEEE AUTOTESTCON 2011: SYSTEMS READINESS TECHNOLOGY CONFERENCE, 2011, : 35 - 39
  • [35] Personal view: 'Don't ask, don't tell' - the undesirable consequences of incidental test results in gastroenterology
    Sonnenberg, A
    ALIMENTARY PHARMACOLOGY & THERAPEUTICS, 2004, 20 (04) : 381 - 387
  • [36] <it>PLASMODIUM MALARIAE</it>- IF AT FIRST YOU DON'T SUCCEED, TEST, TEST AGAIN
    Zhang, Serena
    Kronmann, Karl
    Kavanaugh, Michael
    Blanks, James
    AMERICAN JOURNAL OF TROPICAL MEDICINE AND HYGIENE, 2018, 99 (04): : 314 - 314
  • [37] CONCEAL, DON'T FEEL, DON'T LET IT SHOW: INTENTIONAL VERSUS INSTRUCTED CHEATING IN THE CONCEALED INFORMATION TEST
    Geven, Linda
    Selle, Nathalie Klein
    Ben-Shakhar, Gershon
    Kindt, Merel
    Verschuere, Bruno
    PSYCHOPHYSIOLOGY, 2017, 54 : S12 - S12
  • [38] Reducing Test Point Overhead with Don't-Cares
    Chang, Kai-Hui
    Chang, Chia-Wei
    Jiang, Jie-Hong Roland
    Liu, Chien-Nan Jimmy
    2012 IEEE 55TH INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS (MWSCAS), 2012, : 534 - 537
  • [39] Why don't physicians test for HIV? Authors' reply
    Burke, Ryan C.
    Sepkowitz, Kent A.
    Bernstein, Kyle T.
    Begier, Elizabeth M.
    AIDS, 2008, 22 (01) : 163 - 163
  • [40] On finding don't cares in test sequences for sequential circuits
    Higami, Yoshinobu
    Kajihara, Seiji
    Pomeranz, Irith
    Kobayashi, Shin-ya
    Takamatsu, Yuzo
    IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2006, E89D (11): : 2748 - 2755