共 50 条
- [31] A Don't Care Identification Method for Test Compaction PROCEEDINGS OF THE 2013 IEEE 16TH INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS & SYSTEMS (DDECS), 2013, : 215 - 218
- [34] Relays Fail - Test Systems Don't Have To IEEE AUTOTESTCON 2011: SYSTEMS READINESS TECHNOLOGY CONFERENCE, 2011, : 35 - 39
- [36] <it>PLASMODIUM MALARIAE</it>- IF AT FIRST YOU DON'T SUCCEED, TEST, TEST AGAIN AMERICAN JOURNAL OF TROPICAL MEDICINE AND HYGIENE, 2018, 99 (04): : 314 - 314
- [38] Reducing Test Point Overhead with Don't-Cares 2012 IEEE 55TH INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS (MWSCAS), 2012, : 534 - 537
- [40] On finding don't cares in test sequences for sequential circuits IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2006, E89D (11): : 2748 - 2755