SIMULATION OF VERY LARGE SCALE INTEGRATED CIRCUITS. AN OVERVIEW.

被引：0

作者：

Garbs, R.T.

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来源：

Modeling and Simulation, Proceedings of the Annual Pittsburgh Conference | 1979年

关键词：

COMPUTER SIMULATION;

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摘要：

The computer simulation of very large scale integrated circuits (VLSI) is an excellent example of a well-defined modeling problem. Input parameters are easily measured and simulation results can be compared with the actual devices when they are produced. This paper describes the use of mathematical models of physical systems, e. g. MOS transistors, in a simulation program in order to design high performance, inexpensive integrated circuit products.

引用

共 50 条

[1] Wiring Algorithms for Very Large Scale Integrated Circuits.
Rothermel, Hans-Juergen
Fortschritt-Berichte der VDI-Zeitschriften, Reihe 10: Angewandte Informatik, 1984, (32):
[2] SYSTEM FOR INTERACTIVE EDITING OF THE TOPOLOGY OF VERY-LARGE-SCALE INTEGRATED CIRCUITS.
Yurashanskii, E.G.
Yurin, K.E.
Optoelectronics, Instrumentation and Data Processing (English translation of Avtometriya), 1986, (04): : 115 - 118
[3] DYNAMIC INSPECTION OF LARGE SCALE INTEGRATED CIRCUITS.
Child, M.R.
Ranasinghe, D.W.
White, D.
Microelectronics Journal, 1976, 7 (03) : 43 - 48
[4] RELIABILITY ASSURANCE FOR LARGE SCALE INTEGRATED CIRCUITS.
McDonald, Robert A.
AGARD Conference Proceedings, 1979, (261 Avionics Reliab): : 1 - 25
[5] HIGH ACCURACY AND AUTOMATIC MEASUREMENT OF THE PATTERN LINEWIDTH ON VERY LARGE SCALE INTEGRATED CIRCUITS.
Yamaji, H.
Miyoshi, M.
Kano, M.
Okumura, K.
Scanning Electron Microscopy, 1985, (pt 1) : 97 - 102
[6] PROBLEMS OF TESTING LARGE-SCALE INTEGRATED CIRCUITS.
Waters, D.G.P.
British Telecommunications Engineering, 1982, 1 (pt 2): : 64 - 69
[7] PARAMETRIC TESTING OF INTEGRATED CIRCUITS - AN OVERVIEW.
Boesenberg, Wolfram A.
Goldsmith, Norman
RCA engineer, 1985, 30 (02): : 29 - 33
[8] ELECTRON BEAM TESTING OF ULTRA LARGE SCALE INTEGRATED CIRCUITS.
Garth, Simon C.J.
Microelectronic Engineering, 1986, 4 (02) : 121 - 138
[9] Metallography of very large scale integrated circuits
Metallographie an hochintegrierten Schaltkreisen
Burger, K., 1990, (27):
[10] PATTERN DEFINITION FOR THE MANUFACTURE OF LARGE-SCALE INTEGRATED CIRCUITS.
Heslop, C.J.
Hines, R.E.
Woodward, J.W.
Post Office Electrical Engineers Journal, 1981, 73 (pt 4): : 208 - 215

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