Probe-beam diffraction in a pulsed top-hat beam thermal lens with a mode-mismatched configuration

被引:0
|
作者
机构
来源
Appl. Opt. | / 24卷 / 5241期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [1] Probe-beam diffraction in a pulsed top-hat beam thermal lens with a mode-mismatched configuration
    Li, BC
    Welsch, E
    APPLIED OPTICS, 1999, 38 (24) : 5241 - 5249
  • [2] Fresnel diffraction model for mode-mismatched thermal lens with top-hat beam excitation
    Li, B
    Xiong, S
    Zhang, Y
    APPLIED PHYSICS B-LASERS AND OPTICS, 2005, 80 (4-5): : 527 - 534
  • [3] Fresnel diffraction model for mode-mismatched thermal lens with top-hat beam excitation
    B. Li
    S. Xiong
    Y. Zhang
    Applied Physics B, 2005, 80 : 527 - 534
  • [4] An analytical model for top-hat long transient mode-mismatched thermal lens spectroscopy
    Sabaeian, M.
    Rezaei, H.
    JOURNAL OF THE EUROPEAN OPTICAL SOCIETY-RAPID PUBLICATIONS, 2016, 11
  • [5] PROBE BEAM IMAGE DETECTION FOR MODE-MISMATCHED DUAL-BEAM THERMAL LENS SPECTROMETRY
    SHEN, J
    SOROKA, AJ
    BAESSO, ML
    SNOOK, RD
    JOURNAL DE PHYSIQUE IV, 1994, 4 (C7): : 91 - 94
  • [6] Mode-mismatched confocal thermal-lens microscope with collimated probe beam
    Cabrera, Humberto
    Korte, Dorota
    Franko, Mladen
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2015, 86 (05):
  • [7] Pulsed laser induced mode-mismatched crossed-beam thermal lens measurements
    Li, BC
    Zhang, SY
    Fang, JW
    Shui, XJ
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1997, 68 (07): : 2741 - 2749
  • [8] In situ measurement on ultraviolet dielectric components by a pulsed top-hat beam thermal lens
    Li, BC
    Martin, S
    Welsch, E
    APPLIED OPTICS, 2000, 39 (25) : 4690 - 4697
  • [9] Pulsed top-hat beam thermal-lens measurement for ultraviolet dielectric coatings
    Li, BC
    Martin, S
    Welsch, E
    OPTICS LETTERS, 1999, 24 (20) : 1398 - 1400
  • [10] In situ measurement on ultraviolet dielectric components by a pulsed top-hat beam thermal lens
    Inst. fur Optik/Quantenelektron., Friedrieh-Schiller-Univ. Jena, Max-Wien-Platz 1, D-07743 Jena, Germany
    Applied Optics, 2000, 39 (25): : 4690 - 4697