Ultrathin quasi-monocrystalline silicon films for electronic devices

被引:0
作者
Inst. für Phys. Elektronik, Universität Stuttgart, Pfaffenwaldring 47, DE-70569 Stuttgart, Germany [1 ]
机构
来源
Diffus Def Data Pt B | / 229-234期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
[21]   Solution-Phase Epitaxial Growth of Quasi-Monocrystalline Cuprous Oxide on Metal Nanowires [J].
Sciacca, Beniamino ;
Mann, Sander A. ;
Tichelaar, Frans D. ;
Zandbergen, Henny W. ;
van Huis, Marijn A. ;
Garnett, Erik C. .
NANO LETTERS, 2014, 14 (10) :5891-5898
[22]   Nonthermal structural transformation in quasi-monocrystalline graphite during 100-fs laser pulse [J].
Kudryashov, SI ;
Emel'yanov, VI .
JETP LETTERS, 2001, 73 (09) :487-490
[23]   Structural, electronic, and dielectric properties of ultrathin zirconia films on silicon [J].
Sayan, S ;
Nguyen, NV ;
Ehrstein, J ;
Emge, T ;
Garfunkel, E ;
Croft, M ;
Zhao, XY ;
Vanderbilt, D ;
Levin, I ;
Gusev, EP ;
Kim, H ;
McIntyre, PJ .
APPLIED PHYSICS LETTERS, 2005, 86 (15) :1-3
[24]   Nonthermal structural transformation in quasi-monocrystalline graphite during 100-fs laser pulse [J].
S. I. Kudryashov ;
V. I. Emel’yanov .
Journal of Experimental and Theoretical Physics Letters, 2001, 73 :487-490
[25]   Light Trapping in Ultrathin Monocrystalline Silicon Solar Cells [J].
Yu, Ki Jun ;
Gao, Li ;
Park, Jae Suk ;
Lee, Yu Ri ;
Corcoran, Christopher J. ;
Nuzzo, Ralph G. ;
Chanda, Debashis ;
Rogers, John A. .
ADVANCED ENERGY MATERIALS, 2013, 3 (11) :1401-1406
[26]   MONOCRYSTALLINE-SILICON MICROWAVE MEMS DEVICES [J].
Oberhammer, Joachim ;
Sterner, Mikael ;
Somjit, Nutapong .
ADVANCED MATERIALS AND TECHNOLOGIES FOR MICRO/NANO-DEVICES, SENSORS AND ACTUATORS, 2010, :89-100
[27]   Structure and electronic properties of ultrathin gold films on vicinal silicon(111) [J].
Schock, M ;
Surgers, C ;
von Lohneysen, H .
THIN SOLID FILMS, 2003, 428 (1-2) :11-14
[28]   Size effect on the ultrathin ferroelectric film directly grown on silicon for electronic devices [J].
Yuan, Shuoguo ;
Wang, Jinbin ;
Zhong, Xiangli ;
Huang, Jian ;
Zhou, Yichun .
RSC ADVANCES, 2013, 3 (46) :24362-24366
[29]   Rapid identification of ultrathin amorphous damage on monocrystalline silicon surface [J].
Wu, Lei ;
Yu, Bingjun ;
Zhang, Pei ;
Feng, Chengqiang ;
Chen, Peng ;
Deng, Liang ;
Gao, Jian ;
Chen, Siming ;
Jiang, Shulan ;
Qian, Linmao .
PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2020, 22 (23) :12987-12995
[30]   Punchthrough effects on the electrostatic discharge robustness of ultrathin silicon films on insulator devices [J].
Lee, Jam-Wem ;
Tang, Howard .
APPLIED PHYSICS LETTERS, 2006, 89 (10)