CHIP TEMPERATURE MEASUREMENT.

被引：0
作者：
Jung, E.
Klein, W.
Najmann, K.
Richter, S.
机构：
来源：
IBM technical disclosure bulletin | 1984年 / 27卷 / 4 B期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
INTEGRATED CIRCUIT MANUFACTURE
引用
收藏
页码：2421 / 2422
相关论文
共 50 条
[41]   PRESSURE AND FLOW MEASUREMENT. [J].
Wuest, W. .
AGARDograph, 1980, 11 (160)
[42]   Noise and its measurement. [J].
不详 .
NATURE, 1931, 127 :74-75
[43]   OPTICAL CONSISTENCY MEASUREMENT. [J].
Reed, B. .
Paper Technology, 1985, 25 (08)
[44]   The Essentials of mental measurement. [J].
不详 .
EUGENICS REVIEW, 1922, 14 (01) :52-53
[45]   SURFACE ROUGHNESS MEASUREMENT. [J].
Alstad, J.K. ;
Feliss, N.A. .
1600, (25)
[46]   Dimensions and the facts of measurement. [J].
Campbell, N .
PHILOSOPHICAL MAGAZINE, 1942, 33 (225) :761-771
[47]   Systems of electrical measurement. [J].
Smith, FE .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1925, 37 :101-115
[48]   CARRIER MOBILITY MEASUREMENT. [J].
Yoshino, K. .
IEEE transactions on electrical insulation, 1986, EI-21 (06) :999-1006
[49]   SHORE TANK MEASUREMENT. [J].
Kelly, F. .
Petroleum Review, 1987, 41 (490) :30-33
[50]   Surface Roughness Measurement. [J].
Burow, Guenter .
Werkstatt und Betrieb, 1980, 113 (05) :339-343
12345