CHALLENGE OF RELIABILITY.

被引：0
|
作者：
Strube, Arthur R. [1 ]
机构：
[1] IBM, USA, IBM, USA
来源：
IEEE Circuits and Devices Magazine | 1985年 / 1卷 / 03期
关键词：
FULL AVAILABILITY - RELIABILITY ADVANCES;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The question is considered of whether the reliability of technology can be improved at a fast enough rate to meet system needs. A brief historical survey of computer advances demonstrates the important role that reliability has played. Special attention is given to the advances in reliability made possible by the transistor. It is emphasized that new applications followed from advances in reliability. The author believes that full availability' can be obtained from present technologies with the use of redundancy in both memory and logic.
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页码：40 / 45
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