Microcomputer Application for Testing and Fault Location of Analog Circuits Based on a Pattern Recognition Technique.

被引：0

作者：

Druee, Karl Heinz

Fredrich, Wolfgang

Kob, Frieder

机构：

来源：

Nachrichtentechnik Elektronik | 1980年 / 30卷 / 01期

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摘要：

The development of inexpensive and time-saving test methods with automatic fault location is considered. The paper deals with error diagnosis based on a tabulated assignment of measured value deviations and error causes and the introduction of a feature vector.

引用

页码：28 / 30

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