Microcomputer Application for Testing and Fault Location of Analog Circuits Based on a Pattern Recognition Technique.

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作者：
Druee, Karl Heinz
Fredrich, Wolfgang
Kob, Frieder
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来源：
Nachrichtentechnik Elektronik | 1980年 / 30卷 / 01期
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摘要：
The development of inexpensive and time-saving test methods with automatic fault location is considered. The paper deals with error diagnosis based on a tabulated assignment of measured value deviations and error causes and the introduction of a feature vector.
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页码：28 / 30
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