Microcomputer Application for Testing and Fault Location of Analog Circuits Based on a Pattern Recognition Technique.

被引：0
|
作者：
Druee, Karl Heinz
Fredrich, Wolfgang
Kob, Frieder
机构：
来源：
Nachrichtentechnik Elektronik | 1980年 / 30卷 / 01期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The development of inexpensive and time-saving test methods with automatic fault location is considered. The paper deals with error diagnosis based on a tabulated assignment of measured value deviations and error causes and the introduction of a feature vector.
引用
收藏
页码：28 / 30
相关论文
共 50 条
  • [1] MULTIPLE-FAULT LOCATION OF ANALOG CIRCUITS
    BIERNACKI, RM
    BANDLER, JW
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, 1981, 28 (05): : 361 - 367
  • [2] A symbolic approach to the fault location in analog circuits
    Fedi, G
    Liberatore, A
    Luchetta, A
    Manetti, S
    Piccirilli, MC
    ISCAS 96: 1996 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS - CIRCUITS AND SYSTEMS CONNECTING THE WORLD, VOL 4, 1996, : 810 - 813
  • [3] Approach to fault location of large analog circuits
    Zhao, Jian
    Lin, Zhenghui
    Shanghai Jiaotong Daxue Xuebao/Journal of Shanghai Jiaotong University, 31 (05): : 48 - 51
  • [4] Structural Fault Based Specification Reduction for Testing Analog Circuits
    Soon-Jyh Chang
    Chung Len Lee
    Jwu E. Chen
    Journal of Electronic Testing, 2002, 18 : 571 - 581
  • [5] Structural fault based specification reduction for testing analog circuits
    Chang, SJ
    Lee, CL
    Chen, JE
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2002, 18 (06): : 571 - 581
  • [6] Travelling Wave Fault Location Based on Pattern Recognition
    Bustamante-Mparsakis, Xavier
    Maun, Jean-Claude
    Dzienis, Cezary
    Jurisch, Andreas
    2017 IEEE MANCHESTER POWERTECH, 2017,
  • [7] Fault diagnosis of analog circuits with model-based technique
    Catelani, M
    Giraldi, S
    WHERE INSTRUMENTATION IS GOING - CONFERENCE PROCEEDINGS, VOLS 1 AND 2, 1998, : 501 - 504
  • [8] On the application of symbolic techniques to the multiple fault location in low testability analog circuits
    Fedi, G
    Giomi, R
    Luchetta, A
    Manetti, S
    Piccirilli, MC
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-ANALOG AND DIGITAL SIGNAL PROCESSING, 1998, 45 (10): : 1383 - 1388
  • [9] OPTICAL CABLE FAULT LOCATION USING A CORRELATION TECHNIQUE.
    Okada, K.
    Kobayashi, I.
    Hashimoto, K.
    Shibata, T.
    Kosugi, T.
    Nagaki, Y.
    National Bureau of Standards, Special Publication, 1980, : 81 - 84
  • [10] A Technique of Analog Circuits Testing and Diagnosis Based on Neuromorphic Classifier
    Mosin, Sergey
    ADVANCES IN SIGNAL PROCESSING AND INTELLIGENT RECOGNITION SYSTEMS (SIRS-2015), 2016, 425 : 381 - 393
12345