Secondary ion mass spectrometry (SIMS), a new method for the analysis of solids

被引：0
作者：
Maul, J. [1 ]
Flueckiger, U. [1 ]
机构：
[1] Ber. Massenspektrometrie, ATOMIKA Techn. Phys. GmbH, D-8000 Munchen 19, Germany
来源：
Kerntechnik und Atompraxis | 1978年 / 20卷 / 10期
关键词：
Compendex;
D O I：
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学科分类号：
摘要：
Nuclear fuels
引用
收藏
页码：467 / 470
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