Secondary ion mass spectrometry (SIMS), a new method for the analysis of solids

被引：0
|
作者：
Maul, J. [1 ]
Flueckiger, U. [1 ]
机构：
[1] Ber. Massenspektrometrie, ATOMIKA Techn. Phys. GmbH, D-8000 Munchen 19, Germany
来源：
Kerntechnik und Atompraxis | 1978年 / 20卷 / 10期
关键词：
Compendex;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Nuclear fuels
引用
收藏
页码：467 / 470
相关论文
共 50 条
  • [1] Concentration of N and P in SiC investigated by time-of-flight secondary ion mass spectrometry (TOF-SIMS)
    Acartürk, T.
    Semmelroth, K.
    Pensl, G.
    Saddow, S.E.
    Starke, U.
    Mater Sci Forum, (453-456):
  • [2] Interpretation of dominant impurities in Cu films by secondary ion mass spectrometry and glow discharge mass spectrometry
    Lim, Jae-Won
    Bae, Joon Woo
    Mimura, Kouji
    Isshiki, Minoru
    Jpn J Appl Phys Part 1 Regul Pap Short Note Rev Pap, 1 A (373-374):
  • [3] Nanoscale secondary ion mass spectrometry (NanoSIMS) as an analytical tool in the geosciences
    Kilburn, Matt R.
    Wacey, David
    RSC Detection Science, 2015, 2015-January (04): : 1 - 34
  • [4] Response to comments on "How to reveal the correct elemental concentration profiles in poled multicomponent silicate glasses from the data of secondary ion mass spectrometry (SIMS)"
    Kaasik, V. P.
    Lipovskii, A. A.
    Raskhodchikov, D. V.
    Reshetov, I. V.
    Tagantsev, D. K.
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 2019, 523
  • [5] New progress of a 2.45 GHz ECR ion source for carbon positive ion mass spectrometry
    Li, K.
    Peng, S.X.
    Ma, T.H.
    Jiang, Y.X.
    Cui, B.J.
    Wu, W.B.
    Zhang, A.L.
    Guo, Z.Y.
    Chen, J.E.
    Vacuum, 2024, 219
  • [6] SURFACE ANALYSIS BY LOW ENERGY ION SCATTERING SPECTROSCOPY AND SECONDARY ION MASS SPECTROSCOPY.
    Nelson, G.C.
    1600, (07):
  • [7] ANALYSIS OF ION BOMBARDED CYLINDRICAL GEOMETRY SOLIDS.
    Nenadovic, T.
    Bibic, N.
    Meckel, B.
    Milosavljevic, M.
    Nuclear instruments and methods, 1980, 182 (183/pt 1): : 319 - 332
  • [8] Characterization of Japanese lacquer liquid and films by means of evolved gas analysis-ion attachment mass spectrometry
    Meisei University, Department of Chemistry, Faculty of Sciences and Engineering, Hodokubo 2-1-1, Hino Tokyo 191-8506, Japan
    不详
    Anal. Methods, 9 (1943-1947):
  • [9] Thermodynamic Studies of Condensed Phases by Mass Spectrometry at High Temperature: Analysis of the Method and Review of the Results.
    Chatillon, C.
    Pattoret, A.
    Drowart, J.
    High Temperatures - High Pressures, 1975, 7 (02): : 119 - 148
  • [10] NEW TECHNIQUES FOR THE SURFACE ANALYSIS OF NONMETALLIC SOLIDS.
    Heinrich, K.F.J.
    Newbury, D.E.
    Yakowitz, H.
    Journal of Applied Spectroscopy (English Translation of Zhurnal Prikladnoi Spektroskopii), 1600, : 73 - 102
12345