EXPERIMENTAL DETERMINATION OF SINGLE-EVENT UPSET (SEU) AS A FUNCTION OF COLLECTED CHARGE IN BIPOLAR INTEGRATED CIRCUITS.

被引：0
|
作者：
Zoutendyk, J.A. [1 ]
Malone, C.J. [1 ]
Smith, L.S. [1 ]
机构：
[1] JPL, Pasadena, CA, USA, JPL, Pasadena, CA, USA
来源：
IEEE Transactions on Nuclear Science | 1984年 / NS-31卷 / 06期
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摘要：
8
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页码：1167 / 1174
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