Room temperature nanocrystalline silicon single-electron transistors

被引：0
|
作者：
机构：
[1] Tan, Y.T.
[2] Kamiya, T.
[3] Durrani, Z.A.K.
[4] Ahmed, H.
来源：
| 1600年 / American Institute of Physics Inc.卷 / 94期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
22
引用
收藏
相关论文
共 50 条
  • [31] Single-electron transistors
    Hadley, P
    Lientschnig, G
    Lai, MJ
    COMPOUND SEMICONDUCTORS 2002, 2003, 174 : 125 - 132
  • [32] Room temperature molecular single-electron transistor
    Soldatov, ES
    Khanin, VV
    Trifonov, AS
    Gubin, SP
    Kolesov, VV
    Presnov, DE
    Iakovenko, SA
    Khomutov, GB
    Korotkov, AN
    USPEKHI FIZICHESKIKH NAUK, 1998, 168 (02): : 217 - 219
  • [33] Room-temperature single-electron memory
    Yano, Kazuo, 1628, IEEE, Piscataway, NJ, United States (41):
  • [34] ROOM-TEMPERATURE SINGLE-ELECTRON MEMORY
    YANO, K
    ISHII, T
    HASHIMOTO, T
    KOBAYASHI, T
    MURAI, F
    SEKI, K
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1994, 41 (09) : 1628 - 1638
  • [35] Single-electron transistors
    Devoret, M
    Glattli, C
    PHYSICS WORLD, 1998, 11 (09) : 29 - 33
  • [36] Room-temperature single-electron junction
    Facci, P
    Erokhin, V
    Carrara, S
    Nicolini, C
    PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 1996, 93 (20) : 10556 - 10559
  • [37] Synchronous single-electron transfer at room temperature
    Yano, K
    Ishii, T
    Sano, T
    Mine, T
    Murai, F
    Seki, K
    QUANTUM COHERENCE AND DECOHERENCE: FOUNDATIONS OF QUANTUM MECHANICS IN THE LIGHT OF NEW TECHNOLOGY, 1996, : 131 - 134
  • [38] Switching of single-electron oscillations in dual-gated nanocrystalline silicon point-contact transistors
    Khalafalla, MAH
    Mizuta, H
    Durrani, ZAK
    IEEE TRANSACTIONS ON NANOTECHNOLOGY, 2003, 2 (04) : 271 - 276
  • [39] Dark-field optical fault inspection of ∼10 nm scale room-temperature silicon single-electron transistors
    He, Wenkun
    Chu, Kai-Lin
    Abualnaja, Faris
    Jones, Mervyn
    Durrani, Zahid
    NANOTECHNOLOGY, 2023, 34 (50)
  • [40] Silicon single-electron transistors with sidewall depletion gates and their application to dynamic single-electron transistor logic
    Kim, DH
    Sung, SK
    Kim, KR
    Lee, JD
    Park, BG
    Choi, BH
    Hwang, SW
    Ahn, D
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2002, 49 (04) : 627 - 635
12345