Evaluating the safety of self-checking circuits

被引：0

作者：

Zhang, Shujian ^{[1
]}

Muzio, Jon C. ^{[1
]}

机构：

[1] Univ of Victoria, Victoria, Canada

来源：

Journal of Electronic Testing: Theory and Applications (JETTA) | 1995年 / 6卷 / 02期

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摘要：

引用

页码：243 / 253

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