Evaluating the safety of self-checking circuits

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作者：
Zhang, Shujian [1 ]
Muzio, Jon C. [1 ]
机构：
[1] Univ of Victoria, Victoria, Canada
来源：
Journal of Electronic Testing: Theory and Applications (JETTA) | 1995年 / 6卷 / 02期
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页码：243 / 253
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