共 35 条
- [21] A METHOD FOR OBSERVATION OF BACKSCATTERED ELECTRON IMAGE (BEI) OF A SCANNING ELECTRON-MICROSCOPE (SEM) IN SEMI-THIN SECTIONS FOR LIGHT-MICROSCOPY JOURNAL OF ELECTRON MICROSCOPY, 1981, 30 (03): : 260 - 260
- [22] A STUDY OF THE VALUE OF RESIN-EMBEDDED SEMI-THIN SECTIONS AND ELECTRON-MICROSCOPY IN THE DIAGNOSIS OF RENAL BIOPSIES ACTA PATHOLOGICA ET MICROBIOLOGICA SCANDINAVICA SECTION A-PATHOLOGY, 1981, 89 (04): : 257 - 262
- [23] AN IMPROVED METHOD FOR BOTH LIGHT AND ELECTRON-MICROSCOPY OF IDENTICAL SITES IN SEMITHIN TISSUE-SECTIONS UNDER A 300 KV TRANSMISSION ELECTRON-MICROSCOPE JOURNAL OF ELECTRON MICROSCOPY, 1991, 40 (04): : 286 - 286
- [24] AN IMPROVED METHOD FOR BOTH LIGHT AND ELECTRON-MICROSCOPY OF IDENTICAL SITES IN SEMITHIN TISSUE-SECTIONS UNDER 200-KV TRANSMISSION ELECTRON-MICROSCOPE JOURNAL OF ELECTRON MICROSCOPY, 1985, 34 (04): : 438 - 441
- [25] A METHOD FOR DEMONSTRATION OF ALKALINE-PHOSPHATASE ACTIVITY ON BACKSCATTERED ELECTRON IMAGE (BEI) OF SEM IN SEMI-THIN SECTIONS FOR LIGHT-MICROSCOPY JOURNAL OF ELECTRON MICROSCOPY, 1983, 32 (03): : 231 - 231
- [26] OBSERVATION ON BACKSCATTERED ELECTRON IMAGE (BEI) OF A SCANNING ELECTRON-MICROSCOPE (SEM) IN SEMI-THIN SECTIONS FOR LIGHT-MICROSCOPY JOURNAL OF ELECTRON MICROSCOPY, 1982, 31 (03): : 287 - 287
- [27] HEMATOXYLIN AND EOSIN STAINING OF SEMI-THIN SECTIONS OF OSMIUM-TETROXIDE FIXED TISSUES EMBEDDED IN EPOXY-RESIN QUETOL 812 AND COMPARATIVE OBSERVATIONS OF ADJACENT SECTIONS UNDER LIGHT AND ELECTRON-MICROSCOPES JOURNAL OF ELECTRON MICROSCOPY, 1983, 32 (03): : 232 - 233
- [28] NEW STAINING METHODS FOR SEMI-THIN SECTIONS OF ARALDIT EMBEDDED TISSUES - LIGHT PHASE CONTRAST AND FLUORESCENT MICROSCOPICAL STUDIES ACTA ANATOMICA, 1970, 77 (01): : 37 - +
- [29] A RAPID METHOD FOR STAINING THIN SECTIONS OF VESTOPAL W-EMBEDDED TISSUE FOR LIGHT MICROSCOPY EXPERIENTIA, 1967, 23 (09): : 792 - &
- [30] DOUBLE STAINING AVAILABLE FOR STEREOSCOPIC OBSERVATION OF EPOXY-RESIN QUETOL 812-EMBEDDED SEMI-THIN SECTIONS UNDER THE 200 KV TRANSMISSION ELECTRON-MICROSCOPE JOURNAL OF ELECTRON MICROSCOPY, 1984, 33 (02): : 191 - 194