共 50 条
- [31] Force microscopy study of SrTiO3(001) surfaces with single atomic-layer steps JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1999, 38 (6B): : 3946 - 3948
- [32] Force microscopy study of SrTiO3(001) surfaces with single atomic-layer steps Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1999, 38 (6 B): : 3946 - 3948
- [36] 2-DIMENSIONAL EPITAXIAL-GROWTH OF BI2SR2CUOX ON TILTED SRTIO3(001) SUBSTRATES STUDIED BY REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1992, 31 (4A): : L406 - L409
- [38] Growth information carried by reflection high-energy electron diffraction Quantum Dots: Fundamentals, Applications, and Frontiers, 2005, 190 : 221 - 237
- [40] Effect of temperature during homoepitaxial growth of Si on Si(100) on the character of reflection high-energy electron diffraction patterns ST PETERSBURG POLYTECHNIC UNIVERSITY JOURNAL-PHYSICS AND MATHEMATICS, 2023, 16 (03): : 112 - 116