Characterization of nanostructured materials by analytical electron microscopy

被引:0
|
作者
Northeastern Univ, Shenyang, China [1 ]
机构
来源
Acta Metall Sin Engl Ed Ser A Phys Metall Mater Sci | / 4卷 / 279-282期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
3
引用
收藏
相关论文
共 50 条
  • [41] Application of field emission analytical electron microscopy to metal materials
    Maruyama, Naoki
    Morikawa, Hirofumi
    Uemori, Ryuji
    Nippon Steel Technical Report, 1996, (69): : 7 - 12
  • [42] The characterization of nanostructured CVD Ni powders using transmission electron microscopy
    G.J.C. Carpenter
    Z.S. Wronski
    Journal of Nanoparticle Research, 2004, 6 : 215 - 221
  • [43] The characterization of nanostructured CVD Ni powders using transmission electron microscopy
    Carpenter, GJC
    Wronski, ZS
    JOURNAL OF NANOPARTICLE RESEARCH, 2004, 6 (2-3) : 215 - 221
  • [44] Phase analysis of multilayered, nanostructured titanium-base alloys by analytical electron microscopy
    Czyrska-Filemonowicz, Aleksandra
    Buffat, Philippe A.
    MATERIALS TRANSACTIONS, 2007, 48 (05) : 899 - 902
  • [45] CHARACTERIZATION OF CRYSTALLINE PARTICLES IN TISSUE BY ANALYTICAL ELECTRON-MICROSCOPY
    LANGER, AM
    WEISMAN, I
    ADAMS, A
    POOLEY, FD
    JOURNAL OF RHEUMATOLOGY, 1981, 8 (06) : 1018 - 1019
  • [46] Characterization of unstained multiphase polymer systems by analytical electron microscopy
    Correa, CA
    Bonse, BC
    Chinaglia, CR
    Hage, E
    Pessan, LA
    POLYMER TESTING, 2004, 23 (07) : 775 - 778
  • [47] CHARACTERIZATION OF THIN-FILMS BY ANALYTICAL ELECTRON-MICROSCOPY
    HEADLEY, TJ
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (06): : 2902 - 2904
  • [48] Characterization of Fe/Cr multilayers by analytical transmission electron microscopy
    Rennekamp, R
    Thomas, J
    Arnold, B
    Suenaga, K
    FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1998, 361 (6-7): : 621 - 625
  • [49] Quantitative characterization of biotic iron oxides by analytical electron microscopy
    Mavrocordatos, D
    Fortin, D
    AMERICAN MINERALOGIST, 2002, 87 (07) : 940 - 946
  • [50] Characterization of chiral mesoporous materials by transmission electron microscopy
    Ohsuna, T
    Liu, Z
    Che, SN
    Terasaki, O
    SMALL, 2005, 1 (02) : 233 - 237