Ferroelectric transition in an epitaxial barium titanate thin film: Raman spectroscopy and X-ray diffraction study

被引:0
|
作者
机构
[1] El Marssi, M.
[2] Le Marrec, F.
[3] 1,Lukyanchuk, I.A.
[4] Karkut, M.G.
来源
El Marssi, M. (mimoun.elmarssi@u-picardie.fr) | 1600年 / American Institute of Physics Inc.卷 / 94期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] X-ray diffraction study of thin film elastic properties
    Villain, P
    Goudeau, P
    Renault, PO
    Badawi, KF
    ADVANCED ENGINEERING MATERIALS, 2002, 4 (08) : 554 - 557
  • [22] X-ray diffraction study of thin film elastic constants
    Villain, P
    Renault, PO
    Goudeau, P
    Badawi, KF
    REVUE DE METALLURGIE-CAHIERS D INFORMATIONS TECHNIQUES, 2004, 101 (02): : 97 - +
  • [23] Characterization of Barium Strontium Titanate Particles by Means of X-ray Diffraction
    Herrmann, Michael
    Foerter-Barth, Ulrich
    Rossmann, Christian
    Teipel, Ulrich
    CHEMIE INGENIEUR TECHNIK, 2014, 86 (03) : 385 - 388
  • [24] X-ray diffraction studyrevealing phase coexistence in barium titanate stannate
    Volkmar Mueller
    Horst Beige
    Hans-Peter Abicht
    Christian Eisenschmidt
    Journal of Materials Research, 2004, 19 : 2834 - 2840
  • [25] Combinatorial (Ba,Sr)TiO3 thin film growth: X-ray diffraction and Raman spectroscopy
    Bouyanfif, H.
    Wolfman, J.
    El Marssi, M.
    Yuzyuk, Y.
    Bodeux, R.
    Gervais, M.
    Gervais, F.
    JOURNAL OF APPLIED PHYSICS, 2009, 106 (03)
  • [26] Study on Alumina/Lanthanum Oxide X-Ray Diffraction and Raman Spectroscopy
    Wang Yi
    Li Chang-rong
    Zhuang Chang-ling
    SPECTROSCOPY AND SPECTRAL ANALYSIS, 2021, 41 (08) : 2480 - 2483
  • [27] Study on Alumina/Cerium Oxide X-Ray Diffraction and Raman Spectroscopy
    Wang Yi
    Li Chang-rong
    Zeng Ze-yun
    Xi Zuo-bing
    Zhuang Chang-ling
    SPECTROSCOPY AND SPECTRAL ANALYSIS, 2021, 41 (06) : 1841 - 1845
  • [29] Antiparallel ferroelectric domains in photorefractive barium titanate and strontium barium niobate observed by high-resolution x-ray diffraction imaging
    Fogarty, G
    Steiner, B
    CroninGolomb, M
    Laor, U
    Garrett, MH
    Martin, J
    Uhrin, R
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1996, 13 (11) : 2636 - 2643
  • [30] Raman spectroscopic and X-ray diffraction investigations of epitaxial BiCrO3 thin films
    Talkenberger, Andreas
    Himcinschi, Cameliu
    Weissbach, Torsten
    Vijayanandhini, Kannan
    Vrejoiu, Ionela
    Roeder, Christian
    Rafaja, David
    Kortus, Jens
    THIN SOLID FILMS, 2012, 520 (14) : 4590 - 4594