Multiple design error diagnosis and correction in digital VLSI circuits

被引：0
|
作者：
Veneris, Andreas [1 ]
Venkataraman, Srikanth [1 ]
Hajj, Ibrahim N. [1 ]
Fuchs, W.Kent [1 ]
机构：
[1] Univ of Illinois, Urbana, United States
来源：
Proceedings of the IEEE VLSI Test Symposium | 1999年
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
VLSI circuits
引用
收藏
页码：58 / 63
相关论文
共 50 条
  • [31] SIMULATION OF DIGITAL VLSI CIRCUITS.
    Dunn, A.
    1983, (03):
  • [32] Ground bounce in digital VLSI circuits
    Heydari, P
    Pedram, M
    IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2003, 11 (02) : 180 - 193
  • [33] Will VLSI digital circuits exist in GaAs?
    Kanan, R
    Declercq, M
    IEEE ALESSANDRO VOLTA MEMORIAL WORKSHOP ON LOW-POWER DESIGN, PROCEEDINGS, 1999, : 126 - 134
  • [34] FLOORPLAN DESIGN OF VLSI CIRCUITS
    WONG, DF
    LIU, CL
    ALGORITHMICA, 1989, 4 (02) : 263 - 291
  • [35] DESIGN AND SIMULATION OF VLSI CIRCUITS
    SCHEFFER, LK
    DOWELL, RI
    APTE, RM
    HEWLETT-PACKARD JOURNAL, 1981, 32 (06): : 12 - &
  • [36] Design of nanophotonic circuits for autonomous subsystem quantum error correction
    Kerckhoff, J.
    Pavlichin, D. S.
    Chalabi, H.
    Mabuchi, H.
    NEW JOURNAL OF PHYSICS, 2011, 13
  • [37] Can automatic design error correction be applied to large circuits?
    Hoffmann, DW
    Kropf, T
    PROCEEDINGS OF THE 26TH EUROMICRO CONFERENCE, VOLS I AND II, 2000, : 114 - 121
  • [38] A fast algorithm for locating and correcting simple design errors in VLSI digital circuits
    Veneris, AG
    Hajj, IN
    SEVENTH GREAT LAKES SYMPOSIUM ON VLSI, PROCEEDINGS, 1997, : 45 - 50
  • [39] The design of a system for coloured digital radiology with VLSI circuits and GaAs pixel detectors
    Cadeddu, S
    Caligiore, C
    Caria, M
    Lai, A
    LoPresti, D
    Panebianco, S
    Petta, C
    Porcu, P
    Randazzo, N
    Randaccio, P
    Reito, S
    Russo, GV
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1998, 419 (2-3): : 270 - 275
  • [40] A COMPACT THERMAL NOISE MODEL FOR THE INVESTIGATION OF SOFT ERROR RATES IN MOS VLSI DIGITAL CIRCUITS
    LAYMAN, PA
    CHAMBERLAIN, SG
    IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1989, 24 (01) : 79 - 89
12345